Volume 67, Issue 8

First Physics Colloquium Discusses Fast Atomic Force Microscopy
by Alan Goldsmith 

Faculty members and several students gathered in the fifth floor of Furst Hall on February 3 for the first Physics colloquium of a series that will span the spring 2003 semester. The first lecture was delivered by Dr. Fredy R. Zypman, Professor of Physics at Yeshiva College, on the subject of fast atomic force microscopy.

Zypman, who received his bachelor’s degree in Uruguay and his doctorate from Case Western Reserve University, was introduced by Professor Gabriel A. Cwilich, who said that Zypman was “one of the most experienced in our department, with a long and distinguished career.” Zypman has also taught at the University of Puerto Rico and University of North Carolina-Chapel Hill.

Zypman informed the audience that fast atomic force microscopy constituted of the latest techniques in the field.  In order to find out information about the topography of the sample surface in any probe microscope, the tip of the scope must move horizontally, keeping a separation between the sample and the tip.

However, through the use of spectroscopic force, scientists can now use microscopy in ways that provide greater detail about the samples. With spectroscopic force, scientists can scan not only in the horizontal plane, but also by keeping the scan in one place and moving the tip vertically, calculating force against height.  This can lead to more information, such as finding out what kinds of chemical element there are below the tip.

This new technique can have uses in tribology (the study of wear and friction), studying insulating materials, crystal growth, gas absorption, and other areas of science.

Cwilich said that the next meeting of the colloquium will occur on February 17. ¨

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